Features of static and dynamic friction profiles in one and two dimensions on polymer and atomically flat surfaces using atomic force microscopy
نویسندگان
چکیده
In this paper we correlate the Atomic Force Microscope probe movement with surface location while scanning in the imaging and Force versus distance modes. Static and dynamic stick-slip processes are described on a scale of nanometres to microns on a range of samples. We demonstrate the limits and range of the tip apex being fixed laterally in the force versus distance mode and static friction slope dependence on probe parameters. Micron scale static and dynamic friction can be used to purposefully manipulate soft surfaces to produce well defined frictional gradients.
منابع مشابه
Microscopic Friction Studies on Metal Surfaces
Atomically flat and clean metal surfaces exhibit a regime of ultra-low friction at low normal loads. Atomic force microscopy, performed in ultra-high vacuum on Cu(100) and Au(111) surfaces, reveals a clear stick-slip modulation in the lateral force but almost zero dissipation. Significant friction is observed only for higher loads (*4– 6 nN above the pull-off force) together with the onset of w...
متن کاملSensitivity Analysis of Coulomb and HK Friction Models in 2D AFM-Based Nano-Manipulation: Sobol Method
Nanotechnology involves the ability to see and control individual atoms and molecules which are about 100 nanometer or smaller. One of the major tools used in this field is atomic force microscopy which uses a wealth of techniques to measure the topography and investigates the surface forces in nanoscale. Friction force is the representation of the surface interaction between two surfaces an...
متن کاملPreparation and Friction Force Microscopy Measurements of Immiscible, Opposing Polymer Brushes
Solvated polymer brushes are well known to lubricate high-pressure contacts, because they can sustain a positive normal load while maintaining low friction at the interface. Nevertheless, these systems can be sensitive to wear due to interdigitation of the opposing brushes. In a recent publication, we have shown via molecular dynamics simulations and atomic force microscopy experiments, that us...
متن کاملModeling noncontact atomic force microscopy resolution on corrugated surfaces
Key developments in NC-AFM have generally involved atomically flat crystalline surfaces. However, many surfaces of technological interest are not atomically flat. We discuss the experimental difficulties in obtaining high-resolution images of rough surfaces, with amorphous SiO(2) as a specific case. We develop a quasi-1-D minimal model for noncontact atomic force microscopy, based on van der Wa...
متن کاملPreparation of atomically flat surfaces on silicon carbide using hydrogen etching
Hydrogen etching of 6Hand 4H-SiC(0001) surfaces is studied. The aspolished substrates contain a large number of scratches arising from the polishing process which are eliminated by hydrogen etching. Etching is carried out in a flow of hydrogen gas at atmospheric pressure and temperatures around 1600-1700 C attained on a tantalum strip heater. Post-etching atomic force microscopy (AFM) images sh...
متن کامل